Yiran Ding^#, Haiwen Shi^#, Mengqi Zeng*, Lei Fu*, "Exploring Interface Through Synchrotron Radiation Characterization Techniques: A Graphene Case", Adv. Funct. Mater. 2022, 32, 2202469.

Graphene is an atomically thin material for which all atoms are exposed to the interfaces that need to be studied using a nondestructive and sensitive technique. In this review, we summarize and discuss that how to characterize these interfaces by synchrotron radiation techniques to understand the structure and property evolution of graphene.